DocumentCode
1859931
Title
Novel diagnostic and prognostic techniques using electromagnetic interference (EMI) measurements to detect degradation in electronic equipment
Author
Duff, William G. ; Ungar, Louis Y.
Author_Institution
SEMTAS, Fairfax Station, VA, USA
fYear
2012
fDate
10-13 Sept. 2012
Firstpage
188
Lastpage
193
Abstract
Electronic equipment are subject to degradation and failure as a result of aging and corrosion. Diagnosing to the culprit component, however, is usually not obvious. Some strategic and novel electromagnetic interference (EMI) measurements can be utilized to detect and diagnose failures or degradations. Measuring and monitoring the EMI characteristics of a Unit Under Test (UUT) indicates that the circuit is experiencing an anomaly. The approach is ubiquitous, but in this paper we will focus our discussion to power supplies. Within a power supply, the Fourier series of a full wave rectifier contains only even harmonics of the input waveform. If one of the diodes is degraded or has failed, the output spectral component at the input signal frequency and the odd harmonics of the input will not be zero. An odd harmonic of the input signal frequency will provide an indication of degradation or failure of one of the diodes in the bridge. We present potential measuring and monitoring equipment that can provide in situ non-intrusive prognostic and diagnostic results in operational circuits. The EMI signatures will help pinpoint the culprit component, and repair decisions can be made before the unit is removed from its environment, resulting in substantial savings in support costs.
Keywords
Fourier analysis; Fourier series; ageing; bridge circuits; circuit testing; electrical maintenance; electromagnetic interference; failure analysis; fault diagnosis; frequency measurement; harmonic analysis; measurement systems; power supply circuits; rectifying circuits; reliability; spectral analysers; EMI characteristics monitoring; EMI measurements; Fourier series; UUT; aging; bridge; corrosion; diagnostic technique; diode degradation; diode failure; electromagnetic interference measurements; electronic equipment degradation detection; electronic equipment failure; even input waveform harmonics; failure detection; failure diagnosis; full wave rectifier; measuring equipment; monitoring equipment; odd input signal frequency harmonics; operational circuits; output spectral component; power supplies; prognostic technique; repair decisions; unit under test; Bridge circuits; Circuit faults; Degradation; Electromagnetic interference; Harmonic analysis; Monitoring; Rectifiers; EMI; component degradation; corrosion; diagnosis; electromagnetic interference; fault isolation; frequency measurements; prognosis;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 2012 IEEE
Conference_Location
Anaheim, CA
ISSN
1088-7725
Print_ISBN
978-1-4673-0698-0
Type
conf
DOI
10.1109/AUTEST.2012.6334563
Filename
6334563
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