DocumentCode :
1860013
Title :
A new framework for the automatic insertion of mitigation structures in circuits netlists
Author :
Battezzati, Niccolo ; Serrone, Davide ; Violante, Massimo
Author_Institution :
Politec. di Torino, Torino, Italy
fYear :
2010
fDate :
5-7 July 2010
Firstpage :
190
Lastpage :
191
Abstract :
In this paper we present a new software framework to analyze and modify circuits netlists in an automatic fashion. We developed an API that implements low-level functionalities above which it is possible to create complex algorithms. We then developed a second software layer to implement hardening techniques for Single Event Effects (SEEs) in digital microcircuits. Experimental results prove the effectiveness of the automatic introduction of mitigation techniques.
Keywords :
application program interfaces; integrated circuit design; logic design; radiation hardening (electronics); API; automatic insertion; circuits netlists; complex algorithms; digital microcircuits; hardening techniques; low-level functionalities; mitigation structures; single event effects; software framework; software layer; Circuit faults; Field programmable gate arrays; Logic gates; Performance evaluation; Software; Testing; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
Type :
conf
DOI :
10.1109/IOLTS.2010.5560211
Filename :
5560211
Link To Document :
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