Title :
A new framework for the automatic insertion of mitigation structures in circuits netlists
Author :
Battezzati, Niccolo ; Serrone, Davide ; Violante, Massimo
Author_Institution :
Politec. di Torino, Torino, Italy
Abstract :
In this paper we present a new software framework to analyze and modify circuits netlists in an automatic fashion. We developed an API that implements low-level functionalities above which it is possible to create complex algorithms. We then developed a second software layer to implement hardening techniques for Single Event Effects (SEEs) in digital microcircuits. Experimental results prove the effectiveness of the automatic introduction of mitigation techniques.
Keywords :
application program interfaces; integrated circuit design; logic design; radiation hardening (electronics); API; automatic insertion; circuits netlists; complex algorithms; digital microcircuits; hardening techniques; low-level functionalities; mitigation structures; single event effects; software framework; software layer; Circuit faults; Field programmable gate arrays; Logic gates; Performance evaluation; Software; Testing; Tunneling magnetoresistance;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
DOI :
10.1109/IOLTS.2010.5560211