DocumentCode :
1860206
Title :
Reliability prediction of electronic packages
Author :
Dasgupta, Abhijit ; Barker, Donald ; Pecht, Michael
Author_Institution :
Maryland Univ., College Park, MD, USA
fYear :
1990
fDate :
23-25 Jan 1990
Firstpage :
323
Lastpage :
330
Abstract :
An overview is presented of the state of the art in generating analytical models for fatigue life estimation due to mechanical wear-out. The applicability of these models to reliability prediction for electronic packages is examined. In discussing the failure mechanics of common electronic materials, it is convenient to classify the fatigue damage models into brittle damage, ductile damage, and damage in heterogeneous composite materials. Often the failure may not be in the bulk of any individual material but at the interface of two or more materials, and may require a fourth type of damage model
Keywords :
failure analysis; packaging; reliability; brittle damage; ductile damage; electronic packages; failure analysis; fatigue life estimation; heterogeneous composite materials; mechanical wear-out; models; reliability; state of the art; Composite materials; Educational institutions; Electronic packaging thermal management; Electronics industry; Electronics packaging; Fatigue; Predictive models; Process design; Thermal loading; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location :
Los Angeles, CA
Type :
conf
DOI :
10.1109/ARMS.1990.67977
Filename :
67977
Link To Document :
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