DocumentCode :
1860256
Title :
Radiation effects on programmable analog devices and mitigation techniques
Author :
Balen, Tiago R. ; Lubaszewski, Marcelo
Author_Institution :
Univ. Fed. do Rio Grande do Sul - UFRGS, Porto Alegre, Brazil
fYear :
2010
fDate :
5-7 July 2010
Firstpage :
136
Lastpage :
136
Abstract :
Programmable analog devices are susceptible to radiation effects. TID effects are a matter of concern due to the thickness of oxides in common analog technologies and can be mitigated by HBD techniques and shielding. SEEs may also disturb programmable analog devices, and system level techniques based on on-line error detection and self-correction may be applied by using the available programmable resources of the device.
Keywords :
analogue circuits; programmable circuits; radiation effects; semiconductor device testing; HBD technique; TID effect; mitigation technique; programmable analog device; radiation effect; Circuit faults; Field programmable analog arrays; Programming; Radiation effects; Single event upset; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
Type :
conf
DOI :
10.1109/IOLTS.2010.5560221
Filename :
5560221
Link To Document :
بازگشت