Title :
RILM: Reconfigurable inter-layer routing mechanism for 3D multi-layer networks-on-chip
Author :
Rusu, Claudia ; Anghel, Lorena ; Avresky, Dimiter
Author_Institution :
TIMA Lab. (CNRS-UJF-INP), Grenoble, France
Abstract :
In the context of the emerging 3D integration paradigm, chips are built as stacks of several (likely heterogeneous) 2D layers. The topology of their communication network is quite irregular, mainly due to the different topologies of the 2D layers and the partial vertical connection between these layers. In this paper, a reconfigurable inter-layer routing mechanism (RILM) for such topologies is proposed. We firstly present the mechanism of composing the routing algorithms in different layers, through the vertical links, in order to achieve a multi-layer routing algorithm. Reconfiguration of the routing can be done for multiple reasons: to achieve fault-tolerant capability, but also under dynamic changing of the communication requirements, or, simply, to avoid congestions. To obtain a complete routing reconfiguration for the entire stack of layers, we propose a reconfiguration algorithm of the inter-layer routes, as a complement to the 2D routing reconfiguration. Additionally, independently of the 2D routing algorithm properties, RILM tolerates multiple failures of vertical links, as long as the stack of layers is not partitioned.
Keywords :
integrated circuit design; network routing; network-on-chip; three-dimensional integrated circuits; 2D layers; 2D routing reconfiguration; 3D integration paradigm; 3D multilayer networks-on-chip; RILM; communication network; communication requirements; dynamic changing; fault-tolerant capability; multilayer routing algorithm; partial vertical connection; reconfigurable inter-layer routing mechanism; reconfiguration algorithm; vertical links; Algorithm design and analysis; Fault tolerance; Fault tolerant systems; Routing; System recovery; Three dimensional displays; Topology; 3D network-on-chip; deadlock-free; fault-tolerance; reconfiguration; routing;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
DOI :
10.1109/IOLTS.2010.5560222