Title :
An FPGA-based fail-soft system with adaptive reconfiguration
Author :
Noji, Ryoji ; Fujie, Satoshi ; Yoshikawa, Yuki ; Ichihara, Hideyuki ; Inoue, Tomoo
Author_Institution :
Grad. Sch. of Inf. Sci., Hiroshima City Univ., Hiroshima, Japan
Abstract :
Fail-soft systems with reconfigurable devices, which recover themselves by repeating isolation of faulty portions with graceful degradation, have been proposed. In this paper, we proposed a fail-soft system on an FPGA and discuss the performance and availability of the system. The proposed system can infer the type of faults from obtained errors, and then adaptively reconfigure itself autonomously, so that it can achieve high availability while keeping high performance. Case studies show that the proposed system can achieve high availability with high performance by avoiding excessive recovery.
Keywords :
circuit reliability; field programmable gate arrays; FPGA-based fail-soft system; adaptive reconfigurable devices; fault isolation; Adaptive systems; Approximation methods; Availability; Circuit faults; Context; Degradation; Field programmable gate arrays;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
DOI :
10.1109/IOLTS.2010.5560223