• DocumentCode
    1860323
  • Title

    Preparation of nano-scale patterns on the silicon oxide surface by dip-pen nanolithography

  • Author

    Sheu, J.-T. ; Wu, C.H. ; Liu, H.H. ; Chao, T.S.

  • fYear
    2005
  • fDate
    11-15 July 2005
  • Firstpage
    701
  • Abstract
    Dip-pen nanolithography (DPN), which uses un "inked" AFM tip to deposit organic molecules through a water meniscus onto an underlying substrate under ambient conditions, has been used to create N-(2-aminoethyl)-3-amino-propyl-trimethoxysilane (AEAPTMS) nano patterns as linkers for anchoring gold nanoparticles on the surface of SiO2. In this study, conditions of DPN for organic patterns, AEAPTMS, with sub-100 nm dimensions are investigated. Moreover, gold nanoparticles with citrate-negatively-charged surface were deposited selectively on top of DPN organic patterns. Lateral force microscope (LFM) was utilized to differentiate different surface between oxidized semiconductor surfaces and patterned areas with monolayer of AEAPTMS. Line-width as small as 60 nm has been successfully achieved by this method.
  • Keywords
    atomic force microscopy; gold; nanolithography; nanoparticles; nanopatterning; organic compounds; AFM; Au; N-(2-aminoethyl)-3-amino-propyl-trimethoxysilane; SiO2; citrate-negatively-charged surface; dip-pen nanolithography; gold nanoparticles; lateral force microscope; nanoscale patterns; organic molecules; oxidized semiconductor surfaces; silicon oxide surface; Atomic force microscopy; Gold; Lithography; Nanolithography; Nanoparticles; Nanostructures; Nanotechnology; Silicon; Substrates; Surface contamination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2005. 5th IEEE Conference on
  • Print_ISBN
    0-7803-9199-3
  • Type

    conf

  • DOI
    10.1109/NANO.2005.1500862
  • Filename
    1500862