DocumentCode :
1860323
Title :
Preparation of nano-scale patterns on the silicon oxide surface by dip-pen nanolithography
Author :
Sheu, J.-T. ; Wu, C.H. ; Liu, H.H. ; Chao, T.S.
fYear :
2005
fDate :
11-15 July 2005
Firstpage :
701
Abstract :
Dip-pen nanolithography (DPN), which uses un "inked" AFM tip to deposit organic molecules through a water meniscus onto an underlying substrate under ambient conditions, has been used to create N-(2-aminoethyl)-3-amino-propyl-trimethoxysilane (AEAPTMS) nano patterns as linkers for anchoring gold nanoparticles on the surface of SiO2. In this study, conditions of DPN for organic patterns, AEAPTMS, with sub-100 nm dimensions are investigated. Moreover, gold nanoparticles with citrate-negatively-charged surface were deposited selectively on top of DPN organic patterns. Lateral force microscope (LFM) was utilized to differentiate different surface between oxidized semiconductor surfaces and patterned areas with monolayer of AEAPTMS. Line-width as small as 60 nm has been successfully achieved by this method.
Keywords :
atomic force microscopy; gold; nanolithography; nanoparticles; nanopatterning; organic compounds; AFM; Au; N-(2-aminoethyl)-3-amino-propyl-trimethoxysilane; SiO2; citrate-negatively-charged surface; dip-pen nanolithography; gold nanoparticles; lateral force microscope; nanoscale patterns; organic molecules; oxidized semiconductor surfaces; silicon oxide surface; Atomic force microscopy; Gold; Lithography; Nanolithography; Nanoparticles; Nanostructures; Nanotechnology; Silicon; Substrates; Surface contamination;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
Type :
conf
DOI :
10.1109/NANO.2005.1500862
Filename :
1500862
Link To Document :
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