DocumentCode :
1860449
Title :
Electrostatic lens characterization through nanorobotic manipulation
Author :
Liu, Pou ; Arai, Fumihito ; Saito, Yahachi ; Fukuda, Toshio
Author_Institution :
Nagoya Univ., Japan
fYear :
2005
fDate :
11-15 July 2005
Firstpage :
729
Abstract :
Carbon nanotube can be used as an emitter for electron-beam-induced deposition, but the electron beam size is limited to micro scale and therefore cannot he used for creating 3D structures with high resolution. In order to focus the electron beam we created a single hole electrostatic lens and determined its characteristics through nanorobotic manipulation. We used a carbon nanotube bundle as emitter and measured its field emission property. The focused effect of the electrostatic lens was demonstrated through a series of electron beam patterns observed in real time with a field emission microscope inside a scanning electron microscope.
Keywords :
carbon nanotubes; electron beam deposition; electrostatic lenses; field emission electron microscopy; scanning electron microscopy; carbon nanotube; electron beam size; electron-beam-induced deposition; electrostatic lens; emitter; field emission microscope; nanorobotic manipulation; scanning electron microscope; Carbon nanotubes; Electron beams; Electron emission; Electron microscopy; Electrostatic measurements; Flat panel displays; Lenses; Magnetic field measurement; Scanning electron microscopy; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2005. 5th IEEE Conference on
Print_ISBN :
0-7803-9199-3
Type :
conf
DOI :
10.1109/NANO.2005.1500869
Filename :
1500869
Link To Document :
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