DocumentCode :
1860492
Title :
Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation
Author :
Devarakond, Shyam Kumar ; Sen, Shreyas ; Banerjee, Aritra ; Natarajan, Vishwanath ; Chatterjee, Abhijit
Author_Institution :
Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2010
fDate :
5-7 July 2010
Firstpage :
77
Lastpage :
82
Abstract :
In this paper, a novel methodology for continuous real time monitoring of the performance metrics of RF front end modules is proposed. The presented technique involves determination of the RF system parameters using time domain parameter estimation techniques with minimal hardware overhead. The computation of the behavioral parameters of the RF modules is performed at periodic intervals using real time signals through the use of a "parallel model" of the RF front end in the baseband DSP. During specific intervals corresponding to high signal power levels, parameter estimation of the RF front end is performed using a model in the baseband as a reference. The presented technique is used for detection/tracking of performance degradation in analog/RF front ends in real-time and does not require the use of supervised learning algorithms as with prior performance monitoring techniques. Simulation results showing accurate tracking of the distortion parameters of an RF transmitter used to demonstrate the core ideas of this research.
Keywords :
integrated circuit modelling; mixed analogue-digital integrated circuits; parameter estimation; time-domain analysis; DSP; RF system parameters determination; RF transmitter; analog front ends; built-in performance monitoring; mixed-signal/RF front ends; real-time parameter estimation; supervised learning algorithms; time domain parameter estimation techniques; Baseband; Mixers; Monitoring; OFDM; Radio frequency; Real time systems; Testing; OFDM transmitter; RFdistortion monitoring; Real-time estimation; Vandermonte matrix;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
Conference_Location :
Corfu
Print_ISBN :
978-1-4244-7724-1
Type :
conf
DOI :
10.1109/IOLTS.2010.5560231
Filename :
5560231
Link To Document :
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