DocumentCode :
1860679
Title :
Complex nonlinear exponential autoregressive model for shape recognition using neural networks
Author :
Shenshu, Xiong ; Zhaoying, Zhou ; Limin, Zhong ; Tianhong, Cuii
Author_Institution :
Dept. of Precision Instrum., Tsinghua Univ., Beijing, China
Volume :
1
fYear :
1998
fDate :
18-21 May 1998
Firstpage :
289
Abstract :
A complex nonlinear exponential autoregressive (CNEAR) process which models the boundary coordinate sequence for invariant feature extraction to recognize arbitrary shapes on a plane is presented. All the CNEAR coefficients can be synchronically calculated by using a neural network which is simple in structure and, therefore, easy in implementation. The coefficients are adopted to constitute the feature set which are proven to be invariant to the transformation of a boundary such as translation, rotation, scale and choice of the starting point in tracing the boundary. Afterwards, the feature set is used as the input to a complex multilayer perceptron (C-MLP) network for learning and classification. Experimental results show that complicated shapes can be recognized in high accuracy, even in the low-order model. It is also seen that the classification method has a good degree of fault tolerance when noise is present
Keywords :
autoregressive processes; computer vision; feature extraction; image classification; learning (artificial intelligence); multilayer perceptrons; neural nets; nonlinear systems; parameter estimation; CNEAR coefficients; boundary; boundary coordinate sequence; choice; classification; complex multilayer perceptron; complex nonlinear exponential autoregressive model; fault tolerance; feature set; invariant feature extraction; learning; low-order model; neural networks; noise; rotation; scale; shape recognition; starting point; tracing; translation; Character recognition; Electronic mail; Fault tolerance; Feature extraction; Instruments; Multi-stage noise shaping; Multilayer perceptrons; Neural networks; Shape; Speech analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
ISSN :
1091-5281
Print_ISBN :
0-7803-4797-8
Type :
conf
DOI :
10.1109/IMTC.1998.679785
Filename :
679785
Link To Document :
بازگشت