Title :
Recent advances in Beam Optics Analyzer
Author :
Thuc Bui ; Read, Mike ; Ming-Chieh Lin ; Ives, R. Lawrence ; Tallis, Billy ; Hien Tran
Author_Institution :
Calabazas Creek Res. Inc., Mountain View, CA, USA
Abstract :
Beam Optics Analyzer (BOA) is a finite element, particle-in-cell, charged particle code. We will present its recent advances including methodologies and numerical results to simulate a gridded magnetron, study surface coating by investigating backscattered electron penetration depth, and use permanent magnets to focus doubly converged electron beams.
Keywords :
electron backscattering; electron beams; magnetrons; permanent magnets; BOA; backscattered electron penetration depth; beam optics analyzer; charged particle code; doubly converged electron beams; finite element code; gridded magnetron; particle-in-cell code; permanent magnets; surface coating; Computational modeling; Electron beams; Magnetostatic waves; Magnetostatics; Permanent magnets; Radio frequency; Adaptive Meshing; Doubly Converged Electron Beams; Finite Element; Gridded Magnetron; Magnetostatics; Monte Carlo; Particle-In-Cell; Permanent Magnet; Secondary Emission;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2015 IEEE International
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7109-1
DOI :
10.1109/IVEC.2015.7223806
