• DocumentCode
    1860726
  • Title

    Characterization and comparison of noise generation for quasi-resonant and pulse-width modulated converters

  • Author

    Hsiu, Lengnien ; Goldman, Matthew ; Witulski, Arthur F. ; Kerwin, William ; Carlsten, Ronald

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
  • fYear
    1991
  • fDate
    24-27 Jun 1991
  • Firstpage
    504
  • Lastpage
    509
  • Abstract
    A buck converter with a given output filter is operated with pulsewidth modulated (PWM) and quasi-resonant switching schemes at the same nominal load and switching frequency. Electromagnetic interference (EMI) generated by the natural switching action of the converter is examined by spectral analysis. Interference caused by excitation of parasitic elements is examined experimentally. Quasi-resonant converters are found to have a lower switching frequency harmonic bandwidth than the equivalent PWM converter. The most significant parasitic responses are the turn-on current and turn-off voltage of the catch diode, and the gate current of the MOSFET. A significant decrease in radiated and conducted noise is obtained when the gate drive voltage rise and fall times are increased, which is possible without loss of efficiency using quasi-resonant switching
  • Keywords
    electromagnetic interference; power convertors; pulse width modulation; switching; EMI; MOSFET; PWM; buck converter; catch diode; electromagnetic interference; gate current; gate drive voltage; noise generation; pulsewidth modulation; quasi-resonant switching; spectral analysis; switching frequency harmonic bandwidth; turn-off voltage; turn-on current; Buck converters; Character generation; Electromagnetic interference; Filters; Noise generators; Pulse width modulation; Pulse width modulation converters; Switching converters; Switching frequency; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1991. PESC '91 Record., 22nd Annual IEEE
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-7803-0090-4
  • Type

    conf

  • DOI
    10.1109/PESC.1991.162721
  • Filename
    162721