DocumentCode :
1860740
Title :
High-efficiency back-junction silicon solar cell with an in-line evaporated aluminum front grid
Author :
Kessler, M. ; Münster, D. ; Neubert, T. ; Mader, C.P. ; Schmidt, J. ; Brendel, R.
Author_Institution :
Inst. for Solar Energy Res. Hamelin (ISFH), Emmerthal, Germany
fYear :
2011
fDate :
19-24 June 2011
Abstract :
We present n-type silicon PERT (passivated emitter and rear totally diffused) solar cells with an Al2O3/SiNx-passivated BBr3-diffused back-junction emitter. The aluminum front side grid is evaporated in an industrial-type in-line evaporation system. The efficiency of the best 4 cm2 solar cell is 19.6%, the fill factor is 79%, the open-circuit voltage is 660 mV and the short-circuit current density is 37.6 mA/cm2. We use (700±10) μm-thick silicon shadow masks for the in-line evaporation of the aluminum front grid. The masks are fabricated by a laser process and subsequent anisotropic etching. The resulting finger width of the in-line evaporated fingers is (60±20) μm. The dynamic aluminum deposition rate is 5 μm×m/min for a carrier speed of 0.33 m/min. During in-line evaporation the linear thermal expansion of the mask is limited to (15±5) μm. Our n+np+-solar cell structure uses 2 high temperature diffusion processes: A P diffusion and a subsequent B diffusion. An essential element of our cell process is the order of these diffusions: We redistribute the phosphorus atoms of the front surface field during the subsequent high-temperature boron diffusion on the rear. The resulting phosphorus surface concentration is (7±1)×1019 cm3 and the corresponding sheet resistance is (80±10) Ω/□. A reference cell with a front grid statically evaporated in a laboratory-type reactor through a metal mask shows an efficiency of 20.4%. We thus confirm the high quality of the passivated boron back-junction emitter and of the efficiency potential of our solar cell structure.
Keywords :
alumina; boron compounds; diffusion; elemental semiconductors; etching; evaporation; laser materials processing; masks; passivation; short-circuit currents; silicon; silicon compounds; solar cells; thermal expansion; Al2O3-SiNx-BBr3; B-diffusion; P-diffusion; dynamic aluminum deposition rate; efficiency 19.6 percent; efficiency 20.4 percent; front surface field; high temperature diffusion processes; high-efficiency back-junction silicon solar cell; high-temperature boron diffusion; in-line evaporated aluminum front side grid; industrial-type in-line evaporation system; laboratory-type reactor; laser process; linear thermal expansion; metal mask; n-type silicon PERT solar cells; n+np+-solar cell structure; passivated boron diffused back-junction emitter; passivated emitter and rear totally diffused solar cells; phosphorus atoms; phosphorus surface concentration; reference cell; sheet resistance; short-circuit current density; silicon shadow masks; subsequent anisotropic etching; voltage 660 mV; Aluminum oxide; Boron; Fingers; Laboratories; Photovoltaic cells; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186141
Filename :
6186141
Link To Document :
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