DocumentCode :
1860761
Title :
Mutual coupling in interconnect lines: analysis using finite difference time domain method
Author :
Farahat, Nader ; Mittra, Raj ; Agosto, Jorge
Author_Institution :
Polytech. Univ. of Puerto Rico, San Juan, Puerto Rico
fYear :
2005
fDate :
10-13 May 2005
Firstpage :
21
Lastpage :
24
Abstract :
In this paper, we present a simple technique for analyzing the mutual coupling effects in interconnects using the finite difference time domain (FDTD) method. The interconnect lines are divided into a set of uniform segments of parallel lines with short lengths. Next, the mutual capacitances and inductances of each of these segments are extracted by incorporating the FDTD solution into the telegrapher´s equations. Two examples of coplanar lines and microstrip lines on different dielectric substrates are studied.
Keywords :
coplanar transmission lines; coupled circuits; dielectric materials; finite difference time-domain analysis; integrated circuit interconnections; microstrip lines; network analysis; coplanar lines; dielectric substrates; finite difference time domain method; interconnect lines; microstrip lines; mutual capacitance; mutual coupling; mutual inductance; telegrapher equations; Capacitance; Dielectric substrates; Equations; Finite difference methods; Inductance; Integrated circuit interconnections; Microstrip; Mutual coupling; Time domain analysis; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 2005. Proceedings. 9th IEEE Workshop on
Print_ISBN :
0-7803-9054-7
Type :
conf
DOI :
10.1109/SPI.2005.1500883
Filename :
1500883
Link To Document :
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