Measurement of power delivery system impedance, current and switching activity on functioning die

Author

Kantorovich, I. ; Drabkin, Victor ; Houghton, C. ; St Laurent, J.

Author_Institution

Intel Corp., Hudson, MA, USA

fYear

2005

fDate

10-13 May 2005

Firstpage

35

Lastpage

38

Abstract

Power delivery system (PDS) noise, current and impedance are major indicators of chip performance. The paper considers an approach in which on-chip impedance measurement is conducted for controlled periodic step-wise computer process. The main difficulty of the approach is current reconstruction. Current can be obtained from measured equivalent conductance of the chip, which can serve as a quantification of chip activity.

Keywords

electric admittance measurement; electric current measurement; electric impedance measurement; integrated circuit noise; power supply circuits; chip activity quantification; chip performance; circuit noise; current measurement; current reconstruction; equivalent conductance measurement; functioning die; impedance measurement; power delivery system; step-wise computer process; switching activity; Clocks; Current measurement; Frequency; Impedance measurement; Packaging; Performance evaluation; Power measurement; Semiconductor device measurement; Silicon; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Signal Propagation on Interconnects, 2005. Proceedings. 9th IEEE Workshop on

Print_ISBN

0-7803-9054-7

Type

conf

DOI

10.1109/SPI.2005.1500888

Filename

1500888