• DocumentCode
    1860947
  • Title

    The mobility measurement of positive charge carrier in n-hexane

  • Author

    Ishii, S. ; Aoki, T. ; Nagao, M. ; Kosaki, M.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Toyohashi Univ. of Technol., Japan
  • fYear
    1994
  • fDate
    23-26 Oct 1994
  • Firstpage
    854
  • Lastpage
    859
  • Abstract
    The mobilities of negative ions in liquid dielectrics have been investigated by many researchers. On the other hand, there have been only limited reports on the mobility of positive carriers. To clarify the mechanisms of electrical conduction and breakdown in dielectric liquids, it is also very important to measure the mobilities of positive charge carriers including holes. In this paper the mobility of positive charge carrier in n-hexane was measured by using a thin film tunnel emitter (Al·Al2O3·SiO·Au). This tunnel emitter has excellent features to inject either electrons or holes into a liquid. The mobility was estimated from the transient currents with the time of flight method. The mobility of positive charge carrier was a constant value, 4.7×10-4 cm2 V -1 s-1 for applied field strengths ranging from 50 to 140 kV cm-1. We discuss the carrier species including possible holes
  • Keywords
    carrier mobility; Al·Al2O3·SiO·Au; Al-Al2O3-SiO-Au; applied field strengths; dielectric liquids; electrical breakdown; liquid dielectrics; mobility measurement; n-hexane; positive charge carrier; thin film tunnel emitter; time of flight method; transient currents; Charge carrier processes; Charge carriers; Charge measurement; Current measurement; Dielectric breakdown; Dielectric liquids; Dielectric measurements; Dielectric thin films; Electric breakdown; Electric variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    0-7803-1950-8
  • Type

    conf

  • DOI
    10.1109/CEIDP.1994.592076
  • Filename
    592076