• DocumentCode
    1861267
  • Title

    Sputter deposited p-type nickel oxide thin films as an anode buffer layer in organic solar cells

  • Author

    Kim, Dong-Ho ; Kang, Jae-Wook ; Kim, Hye-Ri ; Kang, Yong-Jin ; Park, Sun-Young ; Jeong, Yong-Soo

  • Author_Institution
    Functional Coatings Res. Group, Korea Inst. of Mater. Sci., Changwon, South Korea
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    P-type NiO thin films were prepared by magnetron sputtering and their characteristic properties were investigated with varying oxygen gas ratio in sputtering ambient. From the measurements of Hall effect and Seebeck coefficient, the films were confirmed to be of p-type conduction. NiO films were applied as the anode buffer layer between ITO and active layer in organic solar cells. Effects of the buffer NiO film on the device performance were systematically studied in this work.
  • Keywords
    Hall effect; Seebeck effect; buffer layers; nickel compounds; semiconductor device measurement; semiconductor thin films; solar cells; sputter deposition; wide band gap semiconductors; Hall effect measurement; ITO; Seebeck coefficient measurement; active layer; anode buffer layer; device performance; magnetron sputtering; organic solar cells; p-type conduction; sputter deposited p-type nickel oxide thin films; varying oxygen gas ratio; Conductivity; Indium tin oxide; Magnetic films; Nickel; Performance evaluation; Sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186164
  • Filename
    6186164