• DocumentCode
    1861379
  • Title

    Full wafer integration of shape memory alloy microactuators using adhesive bonding

  • Author

    Sandström, N. ; Braun, S. ; Stemme, G. ; van der Wijngaart, W.

  • Author_Institution
    Microsyst. Technol. Lab., KTH - R. Inst. of Technol., Stockholm, Sweden
  • fYear
    2009
  • fDate
    21-25 June 2009
  • Firstpage
    845
  • Lastpage
    848
  • Abstract
    This paper presents the wafer-scale manufacturing of microactuators based on bulk shape memory alloy material integrated using adhesive bonding. The work addresses key technical challenges related to the wafer-scale fabrication of bulk SMA micro actuators, including wafer-scale integration of patterned SMA sheets to structured Si wafers and the integration of cold state reset layers to the microactuators. Contact printing of an adhesive polymer ensures a selective bonding when transferring full SMA sheets to silicon structures on a patterned wafer. The stressed films deposited on top of the SMA microactuator ensure a built-in reset mechanism of the actuators. The paper reports on the successful wafer-scale integration of wafer-sized SMA sheets and the wafer-scale fabrication of actuator cantilevers. First test cantilevers with a length of 2.5 mm show a stroke of approx. 180 mum.
  • Keywords
    adhesive bonding; cantilevers; microactuators; shape memory effects; silicon; Si; adhesive bonding; bulk shape memory alloy material; cantilevers; cold state reset layers; contact printing; full wafer integration; microactuators; size 2.5 mm; stressed films; wafer-scale fabrication; Actuators; Fabrication; Microactuators; Polymers; Printing; Pulp manufacturing; Shape memory alloys; Sheet materials; Wafer bonding; Wafer scale integration; MEMS; Microelectromechanical systems; SMA; Titanium-Nickel; adhesive bonding; microactuator; shape memory alloy; wafer-scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
  • Conference_Location
    Denver, CO
  • Print_ISBN
    978-1-4244-4190-7
  • Electronic_ISBN
    978-1-4244-4193-8
  • Type

    conf

  • DOI
    10.1109/SENSOR.2009.5285794
  • Filename
    5285794