• DocumentCode
    1861631
  • Title

    Experimental results from performance improvement and radiation hardening of inverted metamorphic multi-junction solar cells

  • Author

    Patel, Pravin ; Aiken, Daniel ; Boca, Andreea ; Cho, Benjamin ; Chumney, Daniel ; Clevenger, Brad ; Cornfeld, Arthur ; Fatemi, Navid ; Lin, Yong ; McCarty, James ; Newman, Fred ; Sharps, Paul ; Spann, John ; Stan, Mark ; Steinfeldt, Jeff ; Varghese, Tanse

  • Author_Institution
    EMCORE Corp., Albuquerque, NM, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Summary form only given. This paper discusses results from continued development of inverted metamorphic multi-junction (IMM) solar cells with air mass zero (AM0) conversion efficiencies greater than 34%. An experimental best four-junction IMM (IMM4J) design is presented. In an effort to improve IMM performance in space radiation environments, 1-MeV electron irradiation studies are conducted on the individual IMM4J subcells. This data is used to engineer an IMM4J structure with beginning of life (BOL) AM0 conversion efficiency of approximately 34% and an end of life (EOL) remaining factor greater than 82%, where EOL is defined as performance after exposure to 1-MeV electron irradiation at 1E15 e/cm2 fluence. Next generation IMM designs are explored and an avenue toward AM0 conversion efficiencies of greater than 35% is presented.
  • Keywords
    radiation hardening; solar cells; BOL AMO conversion efficiency; EOL; IMM solar cells; IMM4J design; air mass zero conversion efficiencies; electron irradiation study; electron volt energy 1 MeV; individual IMM4J subcells; inverted metamorphic multijunction solar cells; radiation hardening; IEEE Xplore; Next generation networking; Photovoltaic cells; Photovoltaic systems; Radiation effects; Radiation hardening;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186176
  • Filename
    6186176