DocumentCode
1861869
Title
Grading and metastable effects in admittance spectroscopy of CIGS-based solar cells
Author
Decock, K. ; Khelifi, S. ; Pianezzi, F. ; Tiwari, Ayodhya N. ; Burgelman, M.
Author_Institution
Dept. of Electron. & Inf. Syst. (ELIS), Univ. of Gent, Ghent, Belgium
fYear
2011
fDate
19-24 June 2011
Abstract
Cu(In, Ga)Se2-based (CIGS) solar cells have achieved efficiencies up to 20%. Despite these excellent results, the understanding of the underlying mechanisms and the influence of defects on their performance is still incomplete. The determination of the energetic position of the defects and of their density of states is important. Admittance spectroscopy is an adequate technique for this. By varying the external voltage during the measurement, the spatial position where the defect distribution is sensed can be varied. However, the application of external biases can lead to metastable effects in the absorber and therefore to defect relaxation and changes in the doping distribution. Hence, it is important to separate between the effects caused by metastable changes and the change in sensing position of the admittance spectroscopy measurement. This can be achieved by varying the applied voltage during the creation of the metastable state and the measurement itself independently or simultaneously. Admittance spectroscopy under different bias voltage conditions performed on a flexible CIGS-based solar cell are presented and assessed.
Keywords
copper compounds; doping; electric admittance measurement; indium compounds; relaxation; selenium compounds; solar cells; CIGS-based solar cells; Cu(InGa)Se2; absorbers; admittance spectroscopy measurement; defect distribution; doping distribution; energetic position determination; grading effects; metastable effects; relaxation; spatial position; Admittance; Admittance measurement; Density measurement; Photovoltaic cells; Spectroscopy; Temperature measurement; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location
Seattle, WA
ISSN
0160-8371
Print_ISBN
978-1-4244-9966-3
Type
conf
DOI
10.1109/PVSC.2011.6186187
Filename
6186187
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