Title :
Direct measurement of optical phase in the near-field
Author :
Phillips, P.L. ; Knight, Jonathan C. ; Russell, Philip St.J ; Kakarantzas, G. ; Pottage, J.M.
Author_Institution :
Optoelectron. Group, Bath Univ., UK
Abstract :
Summary form only given. Traditionally, the most common measurement in optics is of electromagnetic field intensity. However, to fully characterise guided wave optical devices, one requires knowledge of the spatial variation of both the phase and amplitude within the device. In this work, we measure the intensity and relative phase in the near-field of guided modes in an overmoded optical fiber. For example, the LP/sub 11/ mode consists of two primary lobes of equal intensity but are /spl pi/ out of phase. We have utilised a Mach-Zender interferometer and the technique of near-field optical microscopy to measure this phase difference.
Keywords :
Mach-Zehnder interferometers; intensity measurement; near-field scanning optical microscopy; optical fibre testing; phase measurement; LP/sub 11/ mode; Mach-Zender interferometer; amplitude; direct measurement; electromagnetic field intensity; guided modes; guided wave optical devices; near-field; near-field optical microscopy; optical phase; overmoded optical fiber; phase difference; primary lobes; Apertures; Milling; Optical devices; Optical fibers; Optical filters; Optical microscopy; Optical resonators; Optical waveguides; Phase measurement; Stimulated emission;
Conference_Titel :
Lasers and Electro-Optics, 1999. CLEO '99. Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-595-1
DOI :
10.1109/CLEO.1999.833892
