Title :
Detect Related Bugs from Source Code Using Bug Information
Author :
Wang, Deqing ; Lin, Mengxiang ; Zhang, Hui ; Hu, Hongping
Author_Institution :
State Key Lab. of Software Dev. Environ., Beihang Univ., Beijing, China
Abstract :
Open source projects often maintain open bug repositories during development and maintenance, and the reporters often point out straightly or implicitly the reasons why bugs occur when they submit them. The comments about a bug are very valuable for developers to locate and fix the bug. Meanwhile, it is very common in large software for programmers to override or overload some methods according to the same logic. If one method causes a bug, it is obvious that other overridden or overloaded methods maybe cause related or similar bugs. In this paper, we propose and implement a tool Rebug-Detector, which detects related bugs using bug information and code features. Firstly, it extracts bug features from bug information in bug repositories; secondly, it locates bug methods from source code, and then extracts code features of bug methods; thirdly, it calculates similarities between each overridden or overloaded method and bug methods; lastly, it determines which method maybe causes potential related or similar bugs. We evaluate Rebug-Detector on an open source project: Apache Lucene-Java. Our tool totally detects 61 related bugs, including 21 real bugs and 10 suspected bugs, and it costs us about 15.5 minutes. The results show that bug features and code features extracted by our tool are useful to find real bugs in existing projects.
Keywords :
Java; program debugging; public domain software; source coding; Apache Lucene-Java; Rebug- Detector; Rebug-Detector; bug detection; bug features; bug information; bug repository; code features; open source project; source code; Computer bugs; Data mining; Documentation; Feature extraction; Java; Programming; Software; bug detection; bug features; bug information; code features; common substring;
Conference_Titel :
Computer Software and Applications Conference (COMPSAC), 2010 IEEE 34th Annual
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-7512-4
Electronic_ISBN :
0730-3157
DOI :
10.1109/COMPSAC.2010.27