DocumentCode
1862512
Title
Model for predicting spurious modes caused by fringing fields in lateral electrostatic actuators for MEM resonators
Author
Stoffels, S. ; Rottenberg, X. ; Boedecker, S. ; Puers, R. ; Rembe, C. ; Tilmans, H.A.C.
Author_Institution
IMEC, Leuven, Belgium
fYear
2009
fDate
21-25 June 2009
Firstpage
1417
Lastpage
1420
Abstract
In this paper we present a generalized model for predicting the electromechanical behavior of longitudinal mechanical resonators including the effect of fringing fields on the excitation of spurious flexural modes. We demonstrate the validity and pertinence of our approach by applying our model to the prediction of the vibration amplitudes of square plate resonators. Measured amplitude spectra were obtained with a novel heterodyne interferometer, able to measure exact vibration amplitudes. Our model grasps with good accuracy the measured vibration amplitude, with vibration amplitudes in the order of 1-10 pm, over a range of 22-27 MHz, for both measurements and simulations.
Keywords
electromechanical effects; electrostatic actuators; micromechanical resonators; vibrations; MEM resonator; electromechanical behavior prediction; frequency 22 MHz to 27 MHz; fringing field; heterodyne interferometer; lateral electrostatic actuator; longitudinal mechanical resonator; square plate resonator; vibration amplitude spectra measurement; Capacitance; Capacitors; Electrodes; Electrostatic actuators; Micromechanical devices; Predictive models; Resonance; Transducers; Vibration measurement; Voltage; MEMS; electro-mechanical; fringing fields; interferometer; modeling; resonator;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location
Denver, CO
Print_ISBN
978-1-4244-4190-7
Electronic_ISBN
978-1-4244-4193-8
Type
conf
DOI
10.1109/SENSOR.2009.5285838
Filename
5285838
Link To Document