DocumentCode :
1862512
Title :
Model for predicting spurious modes caused by fringing fields in lateral electrostatic actuators for MEM resonators
Author :
Stoffels, S. ; Rottenberg, X. ; Boedecker, S. ; Puers, R. ; Rembe, C. ; Tilmans, H.A.C.
Author_Institution :
IMEC, Leuven, Belgium
fYear :
2009
fDate :
21-25 June 2009
Firstpage :
1417
Lastpage :
1420
Abstract :
In this paper we present a generalized model for predicting the electromechanical behavior of longitudinal mechanical resonators including the effect of fringing fields on the excitation of spurious flexural modes. We demonstrate the validity and pertinence of our approach by applying our model to the prediction of the vibration amplitudes of square plate resonators. Measured amplitude spectra were obtained with a novel heterodyne interferometer, able to measure exact vibration amplitudes. Our model grasps with good accuracy the measured vibration amplitude, with vibration amplitudes in the order of 1-10 pm, over a range of 22-27 MHz, for both measurements and simulations.
Keywords :
electromechanical effects; electrostatic actuators; micromechanical resonators; vibrations; MEM resonator; electromechanical behavior prediction; frequency 22 MHz to 27 MHz; fringing field; heterodyne interferometer; lateral electrostatic actuator; longitudinal mechanical resonator; square plate resonator; vibration amplitude spectra measurement; Capacitance; Capacitors; Electrodes; Electrostatic actuators; Micromechanical devices; Predictive models; Resonance; Transducers; Vibration measurement; Voltage; MEMS; electro-mechanical; fringing fields; interferometer; modeling; resonator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
Type :
conf
DOI :
10.1109/SENSOR.2009.5285838
Filename :
5285838
Link To Document :
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