• DocumentCode
    1862838
  • Title

    Voltage increase for thin silicon solar cells utilizing epitaxial lateral overgrowth

  • Author

    Hao, Ruiying ; Murcia, C. Paola ; Shreve, Kevin ; Lochtefeld, Anthony ; Leitz, Christopher ; Barnett, Allen

  • Author_Institution
    Solar Power Program, Electr. & Comput. Eng., Univ. of Delaware, Newark, DE, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Epitaxial lateral overgrowth (ELO) has been used to achieve a reduced p-n junction area for thin Si solar cells with the goal of achieving increased voltage. The n-Si absorber is grown by ELO on the p+ Si substrate. In this work, a novel ELO mask is designed, in which the effects of different factors on the voltage can be analyzed separately. The mask design starts from a basic ELO solar cell structure, where there is only one p-n junction. With this structure, the factors that can be studied include the light generation area to p-n junction area ratio, orientation of the growth layer, geometry of the p-n junction and the dielectric material. The second structure has two p-n junctions, with coalescent Si layer resulting from the ELO. The voltage of the selective planar cells has been analyzed first in this work. It shows that the lateral overgrowth region may have a poor quality that results in a loss in open circuit voltage (Voc) and fill factor (FF). The analysis in this work will be the guidance for the future ELO reduced junction thin Si solar cells.
  • Keywords
    epitaxial growth; masks; p-n junctions; semiconductor thin films; silicon; solar cells; ELO mask; ELO reduced junction; ELO solar cell structure; Si; absorbers; coalescent layer; epitaxial lateral overgrowth; fill factor; growth layer orientation; open circuit voltage; p-n junction area ratio; thin silicon solar cells; Epitaxial growth; P-n junctions; Photovoltaic cells; Photovoltaic systems; Silicon; Substrates; Epitaxial later overgrowth; voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186228
  • Filename
    6186228