Title :
Nanoscale Teflon coated surface nano-roughened Si solar cells with Teflon thickness dependent efficiency and hydrophobicity
Author :
Meng, Fan-Shuen ; Pai, Yi-Hao ; Lin, Yung-Hsiang ; Lin, Gong-Ru
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
By employing the SiN and Teflon-like films as surface anti-reflective coatings, the sub-wavelength nano-pillar roughened poly-crystalline Si photovoltaic solar cells are characterized and compared. With 22nm-thick Teflon-like film coating, the bared Si PV cell shows filling factor and energy conversion efficiency of 0.70 and 10.89%, respectively, which are comparable with a standard cell employing standard SiN anti-reflective film to coat the bared Si PV cell. The water contact angle increases from 55° to 92.6° as the Teflon-like film thickness enlarges to 200 nm or larger, whereas the conversion efficiency of the Telfon-like film coated Si PV cell slightly degrades by 1.4% as compared to that of the bared Si PV cell. Lengthening the nano-roughened structure further results in a decreasing reflectance from 30% to 5% and an enhanced scattering to degrade the transmittance from 15% to 3% in visible wavelength region. The nano-pillar surface not only induces the multiple scattering to enhance the Haze and to reduce surface reflectance, but also shadows the incident light to reach the inner cell.
Keywords :
antireflection coatings; contact angle; hydrophobicity; nanostructured materials; rough surfaces; solar cells; PV cell; Si; Teflon thickness dependent efficiency; Teflon-like film coating; efficiency 0.70 percent; efficiency 10.89 percent; energy conversion efficiency; fill factor; hydrophobicity; nanopillar surface; nanoroughened silicon solar cells; nanoroughened structure; nanoscale Teflon coated surface; size 200 nm; size 22 nm; sub-wavelength nanopillar polycrystalline photovoltaic solar cells; surface antireflective coatings; surface reflectance reduction; visible wavelength region; water contact angle; Films; Optical surface waves; Photovoltaic cells; Rough surfaces; Silicon; Surface roughness; Surface treatment;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6186242