Title :
Segmentation on statistical manifold with watershed transform
Author :
Lee, San-Mook ; Abbott, A. Lynn ; Araman, Philip A.
Author_Institution :
Virginia Polytech. Inst. & State Univ., Blacksburg, VA
Abstract :
A watershed transform and a graph partitioning are studied on statistical manifold. Statistical manifold is a 2D Riemannian manifold which is statistically defined by maps that transform a parameter domain onto a set of probability density functions (PDFs). Due to high dimensionality of PDFs, it is hard and computationally expensive to produce segmentation on statistical manifold. In this paper, we propose a method that generates super-pixels using watershed transform. Finding capturing basins on statistical manifold is not straightforward. Here, we create a local distance map using metric tensor defined on statistical manifold. Watershed transform is performed on this local distance map and provides super-pixels that significantly reduce the number of data points and thus make efficient clustering algorithms such as normalized cut (Ncut) feasible to work on. Experimental results show superiority of the proposed method over principal component analysis (PCA) based dimensionality reduction method.
Keywords :
geometry; image segmentation; image texture; pattern recognition; statistical analysis; transforms; 2D Riemannian manifold; clustering algorithms; dimensionality reduction; graph partitioning; image segmentation; local distance map; metric tensor; parameter domain; principal component analysis; probability density functions; statistical manifold; super-pixels; watershed transform; Anisotropic magnetoresistance; Clustering algorithms; Image segmentation; Image texture analysis; Partitioning algorithms; Pattern recognition; Principal component analysis; Probability density function; Tensile stress; Testing; Statistical manifold; segmentation; watershed transform;
Conference_Titel :
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-1765-0
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2008.4711832