• DocumentCode
    1863837
  • Title

    The dynamic breakdown of heart cell membranes exposed to ramp increases in transmembrane potential

  • Author

    O´Neill, R.J. ; Tung, Leslie

  • Author_Institution
    Dept. of Biomed. Eng., Johns Hopkins Univ., Baltimore, MD, USA
  • fYear
    1989
  • fDate
    9-12 Nov 1989
  • Firstpage
    1731
  • Abstract
    The role of electroporation in high-energy shock of cardiac muscle was investigated. Membrane patches of single frog ventricular cells drawn into glass micropipettes were exposed to relatively large transmembrane potentials using a custom-built whole-cell patch clamp unit. The current through the pipette was measured during the application of voltage ramps, which enabled the observation of rapid changes in membrane impedance due to electrical breakdown. The results show that the dynamic electrical breakdown of heart cell membrane involves threshold levels of transmembrane potential above which there exist a period of reversible membrane instability and a rapid, irreversible increase in membrane permeability. The data suggest that the threshold voltages for the onset of these events are independent of the polarity of the applied voltage ramp. The data support the theory that membrane breakdown is a function of transmembrane potential, i.e. a process of electroporation. The advantage of using ramp waveforms for membrane breakdown studies is discussed
  • Keywords
    bioelectric potentials; biomembranes; cardiology; cellular biophysics; cardiac muscle; dynamic breakdown; electroporation; glass micropipettes; heart cell membranes; high-energy shock; ramp increases; reversible membrane instability; single frog ventricular cells; transmembrane potential; Biomembranes; Breakdown voltage; Cells (biology); Clamps; Electric breakdown; Electric shock; Glass; Heart; Muscles; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1989. Images of the Twenty-First Century., Proceedings of the Annual International Conference of the IEEE Engineering in
  • Conference_Location
    Seattle, WA
  • Type

    conf

  • DOI
    10.1109/IEMBS.1989.96428
  • Filename
    96428