DocumentCode :
1863901
Title :
BIT blueprint toward more effective built-in test
Author :
Daugherty, George ; Steinmetz, Mike
Author_Institution :
Martin Marietta Electron. Syst., Orlando, FL, USA
fYear :
1990
fDate :
23-25 Jan 1990
Firstpage :
353
Lastpage :
360
Abstract :
Information is provided concerning built-in test (BIT) and its importance to the military user. The paper is directed at the engineers who design the mission equipment. The discussion points to the need for greater availability in development of weapon systems. To most designers, availability is an unknown and unquantifiable metric that is often ignored. Availability must be defined in terms more easily understood by the design community
Keywords :
automatic testing; design engineering; military computing; military equipment; reliability; weapons; BIT; availability; built-in test; design; military; mission equipment; reliability; weapon systems; Aircraft; Built-in self-test; Costs; Delay; Design engineering; Electronic equipment testing; Life testing; Logistics; Tornadoes; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location :
Los Angeles, CA
Type :
conf
DOI :
10.1109/ARMS.1990.67983
Filename :
67983
Link To Document :
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