Accuracy of defect distributions measured by bias dependent admittance spectroscopy on thin film solar cells

Thin film solar cells have achieved efficiencies up to 20%. Despite these excellent results, the understanding of the underlying mechanisms and the influence of defects on their performance is still incomplete. In thin film solar cells often defect level distributions are present rather than discrete defects. These distributions can be calculated from admittance measurements, however several assumptions are needed which hinder an exact defect density determination. By performing the measurements under different bias voltage conditions the accuracy of the method can be improved and assessed. This is illustrated with measurements on a flexible thin film Cu(In, Ga)Se₂-based (CIGS) solar cell.