XPS as characterization tool for PV: From the substrate to complete III-V multijunction solar cells

Author

Gabás, M. ; López-Escalante, M.C. ; Algora, C. ; Rey-Stolle, I. ; Barrigón, E. ; García, I. ; Galiana, B. ; Palanco, S. ; Bijani, S. ; Ramos-Barrado, J.R.

Author_Institution

Dipt. de Fis. Aplic. I, Univ. de Malaga, Malaga, Spain

fYear

2011

fDate

19-24 June 2011

Abstract

This contribution aims to illustrate the potential of the X-ray photoelectron spectroscopy (XPS) technique as a tool to analyze different parts of a solar cell (surface state, heterointerfaces, profile composition of ohmic contacts, etc). Here, the analysis is specifically applied to III-V multijunction solar cells used in concentrator systems. The information provided from such XPS analysis has helped to understand the physico-chemical nature of these surfaces and interfaces, and thus has guided the technological process in order to improve the solar cell performance.

Keywords

X-ray photoelectron spectra; ohmic contacts; semiconductor heterojunctions; solar cells; solar energy concentrators; GaInP-GaInAs; Ge; X-ray photoelectron spectroscopy technique; XPS technique; characterization tool; concentrator systems; lll-V multijunction solar cells; ohmic contacts; physicochemical nature; solar cell performance; technological process; Copper; Gallium arsenide; Photovoltaic cells; Sputtering; Surface contamination; Surface treatment;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE

Conference_Location

Seattle, WA

ISSN

0160-8371

Print_ISBN

978-1-4244-9966-3

Type

conf

DOI

10.1109/PVSC.2011.6186284

Filename

6186284