DocumentCode :
1864387
Title :
Development of a multi-source solar simulator for spatial uniformity and close spectral matching to AM0 and AM1.5
Author :
Polly, Stephen J. ; Bittner, Zachary S. ; Bennett, Mitch F. ; Raffaelle, Ryne P. ; Hubbard, Seth M.
Author_Institution :
NanoPower Res. Labs., RIT, Rochester, NY, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Results from ongoing development of spatial and spectral quality of RIT´s dual source solar simulator are presented. This simulator as designed qualifies as class A for both AM0 and AM1.5, depending on the filter set used. Measurements were made of spatial intensity uniformity, as well as spectral uniformity across the 300 mm diameter beam under calibrated AM0 conditions. The beam exhibits intensity non-uniformity across the 300 mm diameter test plane of 5.89%, though typically cells can be measured in a 10 cm × 10 cm central region of 1.13% non-uniformity. Spectral match and spectral mismatch values were calculated for specific spectral regions and device structures, respectively, which verified a close match to both AM0 and AM1.5G, especially in the region most commonly used for triple junction solar cells. Results of a set of ten Emcore BTJs measured at Emcore, Aerospace Corporation, NASA Glenn Research Center, and RIT, were compared. It was found that RIT´s simulator produced figures of merit such as VOC, ISC, fill factor, and efficiency, for these cells to within 2% of the other facilities.
Keywords :
solar cells; AM0; AM1.5; Aerospace Corporation; Emcore BTJ; NASA Glenn Research Center; RIT dual source solar simulator; close spectral matching; device structures; efficiency 2 percent; fill factor; filter set; multisource solar simulator; size 300 mm; spatial intensity uniformity; spectral mismatch values; spectral quality; spectral uniformity; triple junction solar cells; Calibration; Current measurement; Gallium arsenide; Junctions; NASA; Photovoltaic cells; Photovoltaic systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186290
Filename :
6186290
Link To Document :
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