DocumentCode :
1864808
Title :
PV inverter performance and reliability: What is the role of the IGBT?
Author :
Kaplar, Robert ; Brock, Reinhard ; DasGupta, Sandeepan ; Marinella, Matthew ; Starbuck, Andrew ; Fresquez, Armando ; Gonzalez, Sigifredo ; Granata, Jennifer ; Quintana, Michael ; Smith, Mark ; Atcitty, Stanley
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2011
fDate :
19-24 June 2011
Abstract :
The inverter is still considered the weakest link in modern photovoltaic systems. Inverter failure can be classified into three major categories: manufacturing and quality control problems, inadequate design, and electrical component failure. It is often difficult to deconvolve the latter two of these, as electrical components can fail due to inadequate design or as a result of intrinsic defects. The aim of the current work is to utilize the extensive background in both inverter performance testing and component reliability found at Sandia National Laboratories to assess the role of component failures in PV performance and reliability. Although there is no consensus on the least reliable component in a modern inverter system, the IGBT is often blamed for failures and hence this was the first component we studied. A commercially available 600V, 60A, silicon IGBT found in common residential inverters was evaluated under normal and extreme operating conditions with DC and pulsed biasing schemes. Although most of the sample devices were robust even under extreme conditions, a few of the samples failed during operation well within the manufacturer-specified limits. Additionally, we have begun in situ monitoring of IGBTs as well as other components within an operating 700 W, single-phase inverter. The in situ testing will guide future device-level work since it allows us to understand the conditions that are experienced by inverter components in a realistic operating environment.
Keywords :
PWM invertors; insulated gate bipolar transistors; quality control; DC biasing scheme; IGBT; PV inverter performance testing; PV inverter reliability; Sandia National Laboratories; current 60 A; electrical component failure; inverter failure; manufacturing problem; power 700 W; pulsed biasing scheme; quality control problem; residential inverter evaluation; single-phase inverter; voltage 600 V; Degradation; Insulated gate bipolar transistors; Inverters; Logic gates; Reliability; Stress; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186311
Filename :
6186311
Link To Document :
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