Mapping of ultra-short electric pulses from a mm-wave bandstop filter via optical probes

Summary form only given. Recently, monolithic mm-wave integrated circuits (MMICs) have experienced significant improvements in bandwidth. Extrapolation of measurements made with all-electronic equipment limited to frequencies below 120 GHz exhibit III-V semiconductor transistors to have maximum frequencies as high as 400 GHz. However, extrapolating measurements from lower frequencies is insufficient for accurate determination of the characteristics of an arbitrary passive or active element. Another frequent restriction of conventional measurement techniques is that the signal can only be probed at specially designed interfaces. With optical sampling techniques it is possible to detect electric fields with a high temporal and spatial resolution of 150 fs and 10 /spl mu/m, respectively, at any point within or outside the device. In this presentation we show the measurement of the spatial field distribution of an ultrashort electric pulse propagating at 200-/spl mu/m/ps velocity through a band-stop filter with a broad stop-band via electo-optic (EO) sampling.