DocumentCode :
1865044
Title :
Retrieval of 2D vector images by matching Weighted Feature Points
Author :
Rayashi, T. ; Kiyono, Tatsuya ; Abe, Koji ; Onai, Rikio
Author_Institution :
Dept. of Comput. Sci., Univ. of Electro-Commun., Chofu
fYear :
2008
fDate :
12-15 Oct. 2008
Firstpage :
961
Lastpage :
964
Abstract :
A novel method for content-based 2D vector image retrieval is proposed in this paper. To retrieve vector images, first, the proposed method extracts WFPs (weighted feature points) from vector images. In this extraction process, the method directly accesses the parameters of Bezier curves defining the shapes of vector images and computes WFPs of the images according to these parameters. Second, to a pair of vector images, the method evaluates similarity by matching WFPs using PTD (proportional transfer distance). In the proposed method, vector images are not rasterized, which enables realtime retrieval. As a prototyping, we have implemented a system for sketch-based vector image retrieval. In the system, a sketch is used as a query. To bridge the representation gap between sketches and vector images in a database, the strokes in sketches are approximated with Bezier curves as a pre- process. Using the system and a database containing 1,120 logomarks, we have confirmed the retrieval performance and have discussed the limits of the proposed method.
Keywords :
content-based retrieval; feature extraction; image retrieval; Bezier curves; content-based 2D vector image retrieval; extraction method; extraction process; logomarks database; proportional transfer distance; query-by-sketch; sketch-based vector image retrieval; weighted feature point matching; Content based retrieval; Control systems; Feature extraction; Image converters; Image databases; Image retrieval; Image segmentation; Information retrieval; Shape; Spatial databases; Bezier curves; content-based image retrieval; feature points; query-by-sketch; vector images;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
Conference_Location :
San Diego, CA
ISSN :
1522-4880
Print_ISBN :
978-1-4244-1765-0
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2008.4711916
Filename :
4711916
Link To Document :
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