• DocumentCode
    1865126
  • Title

    Sparse Non-negative Pattern Learning for image representation

  • Author

    Gong, Dian ; Zhao, Xuemei ; Yang, Qiong

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California, Riverside, CA
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    981
  • Lastpage
    984
  • Abstract
    In this paper, we propose sparse non-negative pattern learning (SNPL) based on self-taught learning framework. In the algorithm, visual patterns are first learned from unlabeled data by non-negative matrix approximation with sparseness constraints, and then features are extracted by the second part of the algorithm, a conjugate family based non-negative sparse feature extraction method. By combining sparse and non-negative constraints of patterns together, SNPL model gives a better representation for images than state-of-art methods. Beyond that, we give an analytical solution for feature extraction although it is approximate, and thereby we extract the features for self-taught learning framework in a faster and more stable way. We apply the new model to various areas, including pattern coding, feature extraction, and recognition. Experimental results show the advantages of SNPL model.
  • Keywords
    approximation theory; feature extraction; image representation; learning (artificial intelligence); sparse matrices; feature extraction method; image representation; matrix approximation; self-taught learning framework; sparse nonnegative visual pattern learning; Approximation algorithms; Data mining; Feature extraction; Image representation; Independent component analysis; Machine learning; Pattern recognition; Principal component analysis; Sparse matrices; Testing; Feature Extraction; Non-negative Matrix Approximation; Pattern Learning; Self Learning; Sparse Representation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4711921
  • Filename
    4711921