• DocumentCode
    1865766
  • Title

    Level set segmentation with outlier rejection

  • Author

    Silveira, Margarida ; Nascimento, Jacinto C. ; Marques, Jorge S.

  • Author_Institution
    Inst. de Sist. e Robot., Lisbon
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1085
  • Lastpage
    1088
  • Abstract
    Geometric active contours based on edges perform poorly in the presence of noise or clutter. When the edges have gaps or are indistinct, the contour leaks through the boundary. Furthermore, when spurious edge points that do not belong to the object are present in the image, the contour is stopped by them and either does not converge to the object boundary or there is oversegmentation. This paper addresses the second difficulty. We propose a novel technique which classifies image features as valid or invalid making the curve stop only at valid features and allowing it to bridge the invalid ones. This is incorporated in the stopping force of boundary based level sets, achieving a robust contour estimation. Our algorithm organizes edge points into connected segments (denoted herein as strokes) and classifies each segment as valid or invalid. A confidence degree (weight) is assigned to each stroke and updated during the evolution process. Thus, the proposed stopping force is adaptive. Experimental results with real data will be provided to illustrate the performance of the proposed algorithm.
  • Keywords
    edge detection; feature extraction; image classification; image segmentation; edge points; geometric active contours; image features; image segmentation; level set segmentation; object boundary; outlier rejection; oversegmentation; robust contour estimation; Active contours; Active noise reduction; Bridges; Equations; Image converters; Image segmentation; Level set; Noise level; Noise robustness; Topology; image segmentation; level set methods; outlier rejection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4711947
  • Filename
    4711947