Title :
Influence of surface charging on secondary-electron yield of MgO film
Author :
Qiang Wei ; Malong Fu ; Shengli Wu ; Wenbo Hu ; Jintao Zhang
Author_Institution :
Key Lab. for Phys. Electron. & Devices of the Minist. of Educ., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
The influence of surface charging on secondary electron emission yield of the MgO film bombarded at low energy electron has been analyzed from charging kinetics and current density effects. The surface charging affects not only the original incident electron energy but also the efficiency of secondary electron emission. We can expect that these results are helpful for accomplishing a secondary electron yield with a slow decay rate for MgO thin film.
Keywords :
magnesium compounds; secondary electron emission; surface charging; thin films; MgO; MgO thin film; charging kinetics; current density; incident electron energy; low energy electron; secondary electron emission; secondary electron yield; surface charging; Charge carrier processes; Current density; Detectors; Electric fields; Electron emission; Films; Surface charging; MgO thin film; charging effect; current density effect; secondary electron yield (SEY);
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2015 IEEE International
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7109-1
DOI :
10.1109/IVEC.2015.7224039
