• DocumentCode
    1865902
  • Title

    Ultrafast carrier relaxation and nonequilibrium phonons in hot carrier solar cells

  • Author

    Goodnick, Stephen M. ; Honsberg, Christiana

  • Author_Institution
    Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    Third generation concepts in photovoltaic devices depend critically on the dynamics of ultrafast carrier relaxation and electron-phonon interactions on very short times scales in nanostructures such as quantum wells, wires and dots. Hot carrier solar cells in particular depend on the reduction in the energy relaxation rate in an absorber material, where hot carriers are extracted through energy selective contacts. Here we investigate the short time carrier relaxation in quantum well, hot electron solar cells under varying photoexcitation conditions using ensemble Monte Carlo (EMC) simulation coupled with rate equation models, to understand the limiting factors affecting cell performance. In particular, we focus on the potential role of hot phonons in reducing the energy loss rate in order to achieve sufficient carrier temperature for efficient performance.
  • Keywords
    Monte Carlo methods; carrier relaxation time; electron-phonon interactions; hot carriers; photoexcitation; quantum wells; solar cells; EMC simulation; absorber material; carrier temperature; electron-phonon interactions; energy loss rate reduction; energy relaxation rate reduction; energy selective contacts; ensemble Monte Carlo simulation; hot carrier solar cells; nanostructures; nonequilibrium phonons; photoexcitation conditions; photovoltaic devices; quantum dots; quantum wells; quantum wires; rate equation models; short-time carrier relaxation; ultrafast carrier relaxation; Electron optics; Energy loss; Hot carriers; Optical scattering; Phonons; Stimulated emission; Ultrafast optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186359
  • Filename
    6186359