DocumentCode :
1865940
Title :
Test of terahertz Extended Interaction oscillator
Author :
Wenxin Liu ; Zhaochuan Zhang ; Chao Zhao ; Xin Guo ; Yong Wang
Author_Institution :
Inst. of Electron., Beijing, China
fYear :
2015
fDate :
27-29 April 2015
Firstpage :
1
Lastpage :
2
Abstract :
In present work, the test of terahertz Extended Interaction oscillator is reported. The high frequency structure (HFS) is employed with the folded waveguide, which is fabricated with high speed numerical milling. The preliminary test shows that the oscillator can produce the power exceeds 2W at operating frequency 308GHz. The optimum design is going forward as planned.
Keywords :
milling; submillimetre wave oscillators; terahertz wave generation; folded waveguide; frequency 308 GHz; high frequency structure; high speed numerical milling; terahertz extended interaction oscillator; Detectors; Directional couplers; Electron optics; Frequency conversion; Optical waveguides; Oscillators; Power generation; Extended Interaction Oscillator; Terahertz Folded Waveguide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2015 IEEE International
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-7109-1
Type :
conf
DOI :
10.1109/IVEC.2015.7224043
Filename :
7224043
Link To Document :
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