DocumentCode
1865940
Title
Test of terahertz Extended Interaction oscillator
Author
Wenxin Liu ; Zhaochuan Zhang ; Chao Zhao ; Xin Guo ; Yong Wang
Author_Institution
Inst. of Electron., Beijing, China
fYear
2015
fDate
27-29 April 2015
Firstpage
1
Lastpage
2
Abstract
In present work, the test of terahertz Extended Interaction oscillator is reported. The high frequency structure (HFS) is employed with the folded waveguide, which is fabricated with high speed numerical milling. The preliminary test shows that the oscillator can produce the power exceeds 2W at operating frequency 308GHz. The optimum design is going forward as planned.
Keywords
milling; submillimetre wave oscillators; terahertz wave generation; folded waveguide; frequency 308 GHz; high frequency structure; high speed numerical milling; terahertz extended interaction oscillator; Detectors; Directional couplers; Electron optics; Frequency conversion; Optical waveguides; Oscillators; Power generation; Extended Interaction Oscillator; Terahertz Folded Waveguide;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2015 IEEE International
Conference_Location
Beijing
Print_ISBN
978-1-4799-7109-1
Type
conf
DOI
10.1109/IVEC.2015.7224043
Filename
7224043
Link To Document