Title :
Yield optimization of analog MOS integrated circuits including transistor mismatch
Author :
Hua Su ; Michael, C.
Author_Institution :
The Ohio State University
Keywords :
Algorithm design and analysis; Circuit optimization; Circuit simulation; Design automation; Design optimization; Integrated circuit modeling; Integrated circuit yield; MOS integrated circuits; MOSFETs; Optimization methods;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
