DocumentCode :
1866475
Title :
Electric contact behavior of Cu-Sn intermetallic compound formed in tin platings
Author :
Shao, C.B. ; Zhang, J.G.
Author_Institution :
Res. Lab. of Electr. Contacts, Beijing Univ. of Posts & Telecommun., China
fYear :
1998
fDate :
26-28 Oct. 1998
Firstpage :
26
Lastpage :
33
Abstract :
An intermetallic compound (IMC) Cu/sub 6/Sn/sub 5/ is formed in tin platings on phosphorous bronze substrates when the coupons are subjected to thermal shocks. The coupons were cross-sectioned to show the growth of Cu-Sn IMC which was identified by X-ray diffraction method. Sliding and fretting electric contact behavior were studied on such surfaces. Previous studies in other laboratories found that the contact resistance in such experiments was quite high. In the present experiments, however, a specially made lubricant was used which dramatically lowered the contact resistance. It was found that the oxide and other contaminant particles normally located in the contact area of the probe were removed by the lubricant. But in agreement with earlier studies, obvious cracks could easily be seen on the surface of the substrate after sliding or fretting experiments. Thus the main beneficial effect of the lubricant in these kinds of experiments was to reduce the contact resistance.
Keywords :
X-ray diffraction; contact resistance; copper alloys; electrical contacts; electroplated coatings; lubrication; thermal shock; tin; tin alloys; Cu-Sn intermetallic compound; Cu/sub 6/Sn/sub 5/; Sn; X-ray diffraction; contact resistance; coupon; electric contact; fretting; lubricant; oxide contaminant particles; phosphorous bronze substrate; sliding; surface cracks; thermal shock; tin plating; Contact resistance; Electric shock; Intermetallic; Laboratories; Lubricants; Probes; Surface contamination; Surface resistance; Tin; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on
Conference_Location :
Arlington, VA, USA
Print_ISBN :
0-7803-4925-3
Type :
conf
DOI :
10.1109/HOLM.1998.722424
Filename :
722424
Link To Document :
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