DocumentCode :
1866737
Title :
Improvement of multi-crystalline silicon solar cell fabricated by laser doping technique using continuous wave laser
Author :
Nishimura, Hideki ; Hirata, Kenji ; Hasegawa, Mitsuhiro ; Funatani, Tomohiro ; Takayama, Tamaki ; Fuyuki, Takashi
Author_Institution :
Nara Inst. of Sci. & Technol. (NAIST), Nara, Japan
fYear :
2011
fDate :
19-24 June 2011
Abstract :
Laser doping (LD) has a lot of advantages for low cost processing and achieving high efficiency crystalline silicon solar cells. This method can operate in the atmosphere and at the room temperature. Thus, LD has much attention as an alternative method instead of the conventional thermal diffusion. In this study, we analyzed multi-crystalline silicon (mc-Si) surface condition and electric property after LD. Moreover, we tried to improve solar cell characteristic. As the result, we confirmed origin of surface roughness after laser doping in silicon. We concluded that origin of surface roughness is PSG on the silicon. And we succeeded to reduce the surface roughness by double laser scan. Finally, we confirmed that the surface roughness caused surface recombination of minority carrier. Therefore, photovoltaic efficiency was increased by improvement of surface roughness.
Keywords :
elemental semiconductors; laser materials processing; minority carriers; semiconductor doping; silicon; solar cells; surface recombination; surface roughness; thermal diffusion; PSG; Si; continuous wave laser; conventional thermal diffusion; double-laser scan; electric property; laser doping technique; minority carrier; multicrystalline silicon solar cell; photovoltaic efficiency; surface condition; surface recombination; surface roughness improvement; Photovoltaic cells; Radiation effects; Rough surfaces; Silicon; Surface emitting lasers; Surface roughness; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-9966-3
Type :
conf
DOI :
10.1109/PVSC.2011.6186390
Filename :
6186390
Link To Document :
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