• DocumentCode
    1866899
  • Title

    From VLSI to WLSI an introduction to 3D wafer level system integration

  • Author

    Chih Hang Tung ; Yu, Doug

  • Author_Institution
    R&D, Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    June 29 2015-July 2 2015
  • Firstpage
    25
  • Lastpage
    25
  • Abstract
    Wafer level system integration (WLSI) as the new system scaling technology platform is taking the stage in parallel to transistor level Moor´s Law scaling to drive the semiconductor industry moving forward in new mobile computing and Internet-of-Thing (IoT) markets. Two key WLSI technology platforms, Chip-on-Wafer-on-Substrate (CoWoS) and Integrated Fan-Out (InFO) are introduced and their merits are discussed. Both CoWoS and InFO are scalable and sustainable to continuously driving future semiconductor industry revolution.
  • Keywords
    VLSI; semiconductor technology; wafer level packaging; 3D wafer level system integration; Internet-of-Thing; VLSI; WLSI; chip-on-wafer-on-substrate; integrated fan-out; mobile computing; semiconductor industry; Electronics industry; Packaging; Speech; Three-dimensional displays; Transistors; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/IPFA.2015.7224323
  • Filename
    7224323