DocumentCode :
1866903
Title :
Eligibility traces through colored noises
Author :
Geist, Matthieu ; Pietquin, Olivier
Author_Institution :
IMS Res. Group, Supelec, Metz, France
fYear :
2010
fDate :
18-20 Oct. 2010
Firstpage :
458
Lastpage :
465
Abstract :
The Gaussian Process Temporal Differences (GPTD) framework initiated statistical modeling of value function approximation. It was followed by the close Kalman Temporal Differences (KTD) approach. Both methods share the same drawback: they provide biased estimates of the value function when transitions of the system to be controlled are stochastic. A colored noise model has been introduced to cope with this problem in the GPTD framework, which actually leads to a Monte-Carlo estimate of the value function. In this paper, we generalize this colored noise model using ideas close to eligibility traces and apply it to the KTD framework. This allows removing the bias when the so-called eligibility factor is set to one, and decreasing it when this factor is strictly between zero and one. The proposed algorithm is experimented on the simple Boyan chain in order to study the effect of the eligibility factor. As KTD generalizes GPTD in the sense that it allows taking into account nonlinear parameterizations, we also propose an experiment combining the new algorithm with a neural network.
Keywords :
Gaussian processes; Monte Carlo methods; function approximation; learning (artificial intelligence); neural nets; noise; Boyan chain; Gaussian process temporal differences framework; Kalman temporal differences framework; Monte-Carlo value function estimate; colored noise model; eligibility traces; neural network; statistical modeling; value function approximation; Colored noise; Equations; Function approximation; Kalman filters; Mathematical model; Prediction algorithms; colored noise; neural networks; reinforcement learning; statistical modeling; value function approximation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultra Modern Telecommunications and Control Systems and Workshops (ICUMT), 2010 International Congress on
Conference_Location :
Moscow
ISSN :
2157-0221
Print_ISBN :
978-1-4244-7285-7
Type :
conf
DOI :
10.1109/ICUMT.2010.5676597
Filename :
5676597
Link To Document :
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