• DocumentCode
    1867105
  • Title

    Series resistance as a function of current and its application in solar cell analysis 37th IEEE photovoltaic specialists conference

  • Author

    Fong, Kean Chern ; McIntosh, Keith R. ; Blakers, Andrew W. ; Franklin, Evan T.

  • Author_Institution
    Australian Nat. Univ., Canberra, ACT, Australia
  • fYear
    2011
  • fDate
    19-24 June 2011
  • Abstract
    The series resistance of a solar cell varies with its operating conditions. However, most solar cell characterization is done by assuming the series resistance is represented as a constant value. This paper presents the application of the multi light method to extract Rs-light and Rs-dark as a function of current. Application of Rs(J) to analysis of solar cell is demonstrated by extracting the Rs-corrected J-V curve. This allows evaluation of the p-n junction without the parasitic Rs effects. Since the Rs(J) and Rs-corrected J-V data is measured in high detail, the total losses from the Rs and the pseudo efficiency can be measured without need of curve fitting. Finally, by including Rs(J) to the modelling of solar cells, errors in parameterization caused by variation in Rs value is eliminated.
  • Keywords
    p-n junctions; solar cells; 37th IEEE photovoltaic specialists conference; Rs-corrected J-V curve; Rs-dark; Rs-light; multilight method; p-n junction; parasitic Rs effects; series resistance; solar cell analysis; Current measurement; Electrical resistance measurement; Lighting; Mathematical model; Photovoltaic cells; Resistance; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-9966-3
  • Type

    conf

  • DOI
    10.1109/PVSC.2011.6186405
  • Filename
    6186405