DocumentCode :
186712
Title :
Mission Profiles derived from lifetests and field return data using inverse problem theory
Author :
Zhongning Liang ; Kho, Ramun M.
Author_Institution :
NXP Semicond., Nijmegen, Netherlands
fYear :
2014
fDate :
1-5 June 2014
Abstract :
Mission Profiles are keys to set reliability requirements. This paper describes a method of Mission Profile deduction from reliability stresses and field return data, using inverse problem theory. This method has been applied to two cases. From the first case (operating-load-case) we can obtain a temperature mission profile and from the second case (environmental-load-case) we have derived temperature and relative humidity mission profiles. The method can be used for more accurate failure rate prediction in the field and lead to more reliable risk assessment.
Keywords :
inverse problems; life testing; risk management; semiconductor device reliability; environmental-load-case; failure rate prediction; field return data; inverse problem theory; lifetests return data; mission profile deduction; operating-load-case; relative humidity mission profiles; reliability requirements; reliability stresses; reliable risk assessment; temperature mission profile; Density functional theory; Humidity; Inverse problems; Load modeling; Reliability; Shape; Stress; Weibull statistics; failure rate; inverse problem theory; mission profiles; risk assessment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2014 IEEE International
Conference_Location :
Waikoloa, HI
Type :
conf
DOI :
10.1109/IRPS.2014.6860616
Filename :
6860616
Link To Document :
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