DocumentCode
186712
Title
Mission Profiles derived from lifetests and field return data using inverse problem theory
Author
Zhongning Liang ; Kho, Ramun M.
Author_Institution
NXP Semicond., Nijmegen, Netherlands
fYear
2014
fDate
1-5 June 2014
Abstract
Mission Profiles are keys to set reliability requirements. This paper describes a method of Mission Profile deduction from reliability stresses and field return data, using inverse problem theory. This method has been applied to two cases. From the first case (operating-load-case) we can obtain a temperature mission profile and from the second case (environmental-load-case) we have derived temperature and relative humidity mission profiles. The method can be used for more accurate failure rate prediction in the field and lead to more reliable risk assessment.
Keywords
inverse problems; life testing; risk management; semiconductor device reliability; environmental-load-case; failure rate prediction; field return data; inverse problem theory; lifetests return data; mission profile deduction; operating-load-case; relative humidity mission profiles; reliability requirements; reliability stresses; reliable risk assessment; temperature mission profile; Density functional theory; Humidity; Inverse problems; Load modeling; Reliability; Shape; Stress; Weibull statistics; failure rate; inverse problem theory; mission profiles; risk assessment;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 2014 IEEE International
Conference_Location
Waikoloa, HI
Type
conf
DOI
10.1109/IRPS.2014.6860616
Filename
6860616
Link To Document