• DocumentCode
    186712
  • Title

    Mission Profiles derived from lifetests and field return data using inverse problem theory

  • Author

    Zhongning Liang ; Kho, Ramun M.

  • Author_Institution
    NXP Semicond., Nijmegen, Netherlands
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Abstract
    Mission Profiles are keys to set reliability requirements. This paper describes a method of Mission Profile deduction from reliability stresses and field return data, using inverse problem theory. This method has been applied to two cases. From the first case (operating-load-case) we can obtain a temperature mission profile and from the second case (environmental-load-case) we have derived temperature and relative humidity mission profiles. The method can be used for more accurate failure rate prediction in the field and lead to more reliable risk assessment.
  • Keywords
    inverse problems; life testing; risk management; semiconductor device reliability; environmental-load-case; failure rate prediction; field return data; inverse problem theory; lifetests return data; mission profile deduction; operating-load-case; relative humidity mission profiles; reliability requirements; reliability stresses; reliable risk assessment; temperature mission profile; Density functional theory; Humidity; Inverse problems; Load modeling; Reliability; Shape; Stress; Weibull statistics; failure rate; inverse problem theory; mission profiles; risk assessment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2014 IEEE International
  • Conference_Location
    Waikoloa, HI
  • Type

    conf

  • DOI
    10.1109/IRPS.2014.6860616
  • Filename
    6860616