• DocumentCode
    1867120
  • Title

    Estimation of optimum coding redundancy and frequency domain analysis of attacks for YASS - a randomized block based hiding scheme

  • Author

    Sarkar, A. ; Nataraj, L. ; Manjunath, B.S. ; Madhow, U.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California at Santa Barbara, Santa Barbara, CA
  • fYear
    2008
  • fDate
    12-15 Oct. 2008
  • Firstpage
    1292
  • Lastpage
    1295
  • Abstract
    Our recently introduced JPEG steganographic method called yet another steganographic scheme (YASS) can resist blind steganalysis by embedding data in the discrete cosine transform (DCT) domain in randomly chosen image blocks. To maximize the embedding rate for a given image and a specified attack channel, the redundancy factor used by the repeat- accumulate (RA) code based error correction framework in YASS is optimally chosen by the encoder. An efficient method is suggested for the decoder to accurately compute this redundancy factor. We also show experimentally which DCT coefficients are better suited for hiding and detection under various attacks. The effectiveness of YASS for robust steganography is demonstrated for certain attacks.
  • Keywords
    discrete cosine transforms; error correction; frequency-domain analysis; image coding; redundancy; steganography; DCT; JPEG steganographic method; YASS; Yet Another Steganographic Scheme; blind steganalysis; decoder; discrete cosine transform; frequency domain analysis; optimum coding redundancy estimation; randomized block based hiding scheme; redundancy factor; repeat-accumulate code based error correction framework; Discrete cosine transforms; Error correction codes; Frequency domain analysis; Frequency estimation; Image coding; Iterative decoding; Redundancy; Robustness; Steganography; Transform coding; randomized hiding; redundancy factor; repeat-accumulate code; steganalysis; steganography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2008. ICIP 2008. 15th IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-1765-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2008.4711999
  • Filename
    4711999