Title :
Degradation and others parameters analysis of different technologie photovoltaic modules
Author :
Débora, P.J. ; Salas, V. ; Fabero, F. ; Alonso-Abella, M. ; Olías, E. ; Chenlo, F. ; Vela, N.
Author_Institution :
Electron. Technol. Dept., Univ. Carlos III de Madrid, Leganés, Spain
Abstract :
This paper discusses and analyzes the degradation of five PV modules of different actual technologies with long-time outdoors exposure. The degradation losses are analyzed by means of the following parameters: short circuit current, open circuit voltage and power. At the same time, this paper compares the degradation of five different technology modules, measured in the same place with the same equipment that captures the parameters measured. It explains the degradation of the modules over time to take into account all the calculations for decision making when designing a photovoltaic installation. Each one of them was set outdoor at the Universidad Carlos III de Madrid, Leganes (Madrid), Spain.
Keywords :
failure analysis; losses; solar cells; degradation analysis; degradation losses; open circuit voltage; outdoors exposure; parameter analysis; photovoltaic installation; photovoltaic modules; short circuit current; Current measurement; Degradation; Photovoltaic systems; Power measurement; Temperature measurement; Voltage measurement;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-9966-3
DOI :
10.1109/PVSC.2011.6186413