• DocumentCode
    186731
  • Title

    Error-resilient design techniques for reliable and dependable computing

  • Author

    Das, S. ; Bull, David ; Whatmough, Paul

  • Author_Institution
    ARM Ltd., Cambridge, UK
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Abstract
    Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive performance targets under strict power budgets. Traditional adaptive techniques that compensate for PVT variations require substantial margining to account for local variations and rapid environmental changes. In this paper, we review a technique called Razor that eliminates worst-case safety margins through in situ error detection and correction of variation-induced delay errors. We present silicon measurement results from multiple industrial and academic demonstration systems that using Razor-based dynamic voltage and frequency management. In particular, we highlight the application of Razor to two specific platforms. The first is an ARM-based industrial prototype where Razor-based dynamic adaptation leads to 52% energy savings at 1GHz operation. The second platform applies Razor for robust operation in the presence of radition-induced Single Event Upsets.
  • Keywords
    error correction; error detection; integrated circuit design; microprocessor chips; radiation hardening (electronics); redundancy; ARM-based industrial prototype; PVT variations; Razor-based dynamic adaptation; Razor-based dynamic voltage management; advanced process nodes; error-resilient design techniques; frequency management; in situ error detection; local variations; power budgets; radiation-induced single event upsets; rapid environmental changes; silicon measurement results; variation-induced delay errors; worst-case safety margins; Clocks; Flip-flops; Latches; Pipelines; Random access memory; Reliability; Timing; Reliable and Robust operation; Temporal Redundancy; Variability-tolerant design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2014 IEEE International
  • Conference_Location
    Waikoloa, HI
  • Type

    conf

  • DOI
    10.1109/IRPS.2014.6860627
  • Filename
    6860627