• DocumentCode
    186733
  • Title

    Resilient and adaptive circuits for voltage, temperature, and reliability guardband reduction

  • Author

    Tokunaga, Carlos ; Ryan, Joseph F. ; Karnik, T. ; Tschanz, James W.

  • Author_Institution
    Circuit Res. Lab., Intel Corp., Hillsboro, OR, USA
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Abstract
    Resilient and adaptive circuit techniques enable architectures that are tolerant to static and dynamic variations such as process variation, voltage droops, temperature and aging. These circuit techniques are key to reduce voltage, temperature and reliability guardbands. Guardbands are used to guarantee that systems will operate correctly when subjected to the variations mentioned previously. However, they incur in significant loss in performance and energy efficiency that tax the system. In addition, these added guardbands also impact the reliability of the system. In this work we present resilient and adaptive circuit techniques implemented in microprocessor and graphics pipelines that demonstrate significant power, guardband reduction and energy efficiency and performance gain.
  • Keywords
    ageing; energy conservation; graphics processing units; integrated circuit reliability; microprocessor chips; adaptive circuit techniques; aging; energy efficiency; graphics pipelines; microprocessor; performance gain; process variation; reliability guardband reduction; resilient circuit technique; temperature reduction; voltage droops; Adaptive systems; Clocks; Energy efficiency; Graphics; Microprocessors; Throughput; Timing; adaptive circuits; error detection; guardband reduction; reliability; resiliency; variation-tolerant;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2014 IEEE International
  • Conference_Location
    Waikoloa, HI
  • Type

    conf

  • DOI
    10.1109/IRPS.2014.6860628
  • Filename
    6860628